Publications
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"Consortium for Electric Reliability Technology Research under competition." IEEE Power Engineering Society (PES) Summer Meeting. Chicago, IL, USA: IEEE, 2002. 1716 - 1717.
"Do "Enabling Technologies" Affect Customer Performance in Price-Responsive Load Programs?." ACEEE Summer Study on Energy Efficiency in Buildings. LBNL, 2002. 16.
. Dynamics, Criticality, and Self-organization in a Model for Blackouts in Power Transmission Systems. 2002.
. . . "Human Factors Aspect of Power System Voltage Visualizations." Hawaii International Conference on System Sciences. IEEE, 2002. 6.
. Impact of Enabling Technologies on Customer Load Curtailment Performance: Summer 2001 Results from NYSERDA’s PON 585 and 577 Programs and NYISO’s Emergency Demand Response Program. LBNL, 2002. LBNL-49858.
. "An Initial Complex Systems Analysis of the Risks of Blackouts in Power Transmission Systems." Conference on Power Systems and Communications Infrastructures for the Future. Beijing, China, 2002. 7.
. "Innovative Developments in Load as a Reliability Resource." IEEE Power Engineering Society Winter Meeting. IEEE, 2002. 3. LBNL-50968.
. . "A New Scheme for Voltage Control in a Competitive Ancillary Service Market." Power Systems Computation Conference (PSCC). Seville, Spain, 2002. 6.
. "Rational Buyer Meets Rational Seller: Reserves Market Equilibria under Alternative Auction Designs." Journal of Regulatory Economics 21.3 (2002) 247-288.
. "Sorry, wrong number: The use and misuse of numerical facts in analysis and media reporting of energy issues." . Annual Review of Energy and the Environment 2002 27 (2002) 119-158. LBNL-50499.
. . . . . . White Paper on Protection Issues of The MicroGrid Concept. 03/2002, 2002.
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"Assessing I-Grid Web-Based Monitoring for Power Quality and Reliability Benchmarking." IEEE PES DSASC Test Feeder Working Group. Berkeley: LBNL, 2003. LBNL-52736.
. "Blackout mitigation assessment in power transmission systems." 36th Annual Hawaii International Conference on System Sciences (HICSS). Big Island, HI, USA: IEEE, 2003. 10 pp.
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