| Title | CERTS Microgrid System Tests |
| Publication Type | Conference Paper |
| Year of Publication | 2007 |
| Authors | John Stevens, David A Klapp |
| Conference Name | 2007 IEEE Power Engineering Society General Meeting |
| Date Published | 07/2007 |
| Publisher | IEEE |
| Conference Location | Tampa, FL, USA |
| ISBN Number | 1-4244-1298-6 |
| Keywords | CERTS, MG-TB001, microgrid test bed, microgrids |
| Abstract | This paper describes field testing of the CERTS Microgrid concepts in an actual hardware installation. The test setup, including hardware that incorporates the CERTS controls, is installed at American Electric Power's Walnut Test Site, near the AEP Dolan Test Center. The results of a variety of tests that cover different scenarios of step load changes and transitions from utility-tied to islanded operation will be described. |
| DOI | 10.1109/PES.2007.385793 |
